| You are in:Home/Publications/ “Integrated Asynchronous Regulation for Nanometric Technologies”, 1st European workshop on CMOS Variability (VARI), May 26-27, Montpellier, France, pp. 86-91. | |
Dr. Hatem Mohamed Mohamed Zakaria Radwan :: Publications: |
|
| Title: | “Integrated Asynchronous Regulation for Nanometric Technologies”, 1st European workshop on CMOS Variability (VARI), May 26-27, Montpellier, France, pp. 86-91. |
| Authors: | Hatem Zakaria, Sylvain Durand, Nicolas Marchand and Laurent Fesquet, |
| Year: | 2010 |
| Keywords: | Not Available |
| Journal: | Not Available |
| Volume: | Not Available |
| Issue: | Not Available |
| Pages: | Not Available |
| Publisher: | Not Available |
| Local/International: | International |
| Paper Link: | Not Available |
| Full paper | Hatem Mohamed Mohamed Zakaria Radwan_paper6-3.pdf |
| Supplementary materials | Not Available |
| Abstract: |
|
