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Dr. Mohamed Tarek Hasan Mohamed Elewa :: Publications: |
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| Title: | “Reliability aspects. of tunnel oxides under different Fowler—Nordheim stress conditions” Proceeding. of the 1991 International Conference on Microelectronics, Cairo, Egypt, PP. 304—307, Dec. 21—23.
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| Authors: | P. MORFOULI, G. PAPADAS, G. GHIBAUDO, G. PANANAKAKIS and M.T. ELEWA |
| Year: | 1991 |
| Keywords: | Not Available |
| Journal: | Not Available |
| Volume: | Not Available |
| Issue: | Not Available |
| Pages: | Not Available |
| Publisher: | Not Available |
| Local/International: | Local |
| Paper Link: | Not Available |
| Full paper | Not Available |
| Supplementary materials | Not Available |
| Abstract: |
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