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Dr. Mohamed Tarek Hasan Mohamed Elewa :: Publications:

Title:
“Novel technique for carrier lifetime measurement by ّ-MOSFET transients” Proceedings 1996 IEEE international SOI conference, Sanibel Island, FL, USA, Oct. , PP 160-161.
Authors: S. Cristoloveanu, T. Elewa, D. Munteanu and A. Ionescu
Year: 1996
Keywords: Not Available
Journal: Not Available
Volume: Not Available
Issue: Not Available
Pages: Not Available
Publisher: Not Available
Local/International: International
Paper Link: Not Available
Full paper Not Available
Supplementary materials Not Available
Abstract:

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